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(2) In future presentations of the research findings, in addition to the course project website and public presentations, your real name and personal information will not appear in this research report. If you are interested in the research results, we can provide you with an executive summary after the study is completed.
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Uedu Semiconductor · 優半導體

從一顆矽晶,讀懂整個半導體世界

製程、材料化學、光學微影、設備、軟體 EDA、元件封裝到國際情勢
用結構化的知識地圖,建立對半導體產業的整體理解

60
知識文章
39
產業公司
16
時事事件
Uedu Semiconductor · 晶圓良率 IN-LINE
晶圓圖 · 良率檢視示範
Wafer map · defect distribution
120
總晶粒數
108
良品數
90.0%
良率
製程節點
節點標籤僅為教學示意
N16N7N5N3
教學示意資料 · 非實際產線量測 · 良率=良品數÷總晶粒數

Illustrative wafer map · yield = 108 / 120 = 90.0%